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Proceedings Paper

Common-path holographic interferometer for flatness testing
Author(s): Pierre M. Jacquot; Xavier Colonna de Lega; Pierre Michel Boone
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Paper Abstract

An interferometer based on a single multi-functional holographic optical element (HOE) is presented. The interferometer is meant for flatness testing of quite large objects, not necessarily optically polished. Other features include two beam common-path arrangement, desensitization as compared to the classical (lambda) /2) figure, white-light illumination. Emphasis is then laid on automatic fringe pattern interpretation which makes use of an ad hoc phase-shifting procedure. Results obtained with computer disks are shown.

Paper Details

Date Published: 15 November 1994
PDF: 11 pages
Proc. SPIE 2248, Optical Measurements and Sensors for the Process Industries, (15 November 1994); doi: 10.1117/12.194311
Show Author Affiliations
Pierre M. Jacquot, Ecole Polytechnique Federale de Lausanne (Switzerland)
Xavier Colonna de Lega, Ecole Polytechnique Federale de Lausanne (Switzerland)
Pierre Michel Boone, State Univ. of Ghent (Belgium)


Published in SPIE Proceedings Vol. 2248:
Optical Measurements and Sensors for the Process Industries
Christophe Gorecki; Richard W. T. Preater, Editor(s)

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