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Proceedings Paper

Profiling of aspherical surfaces using moire deflectometry
Author(s): T. Uitterdijk; Hans Jan Frankena; Kees Smorenburg
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Paper Abstract

An elegant measuring setup for contouring strong aspherical surfaces is introduced. Moire deflectometry is chosen as the measuring method because the configuration is simple, robust, and variable in sensitivity. The instrument is capable of measuring height deviations between an aspherical surface and its best fitting sphere ranging from minimally 1 micrometers to maximally 30 micrometers with a relative accuracy of 10%, which is useful for the production of surfaces in infrared optics. It is possible to measure transparent as well as reflecting surfaces, both convex and concave. A CCD-camera and a PC make part of the setup to automate the measurements. The short measurement time of less than 60 seconds makes the instrument useful in the manual production of aspherical surfaces.

Paper Details

Date Published: 15 November 1994
PDF: 9 pages
Proc. SPIE 2248, Optical Measurements and Sensors for the Process Industries, (15 November 1994); doi: 10.1117/12.194310
Show Author Affiliations
T. Uitterdijk, Delft Univ. of Technology (Netherlands)
Hans Jan Frankena, Delft Univ. of Technology (Netherlands)
Kees Smorenburg, TNO Institute of Applied Physics (Netherlands)


Published in SPIE Proceedings Vol. 2248:
Optical Measurements and Sensors for the Process Industries
Christophe Gorecki; Richard W. T. Preater, Editor(s)

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