Share Email Print
cover

Proceedings Paper

Fully automatic color print inspection by digital image processing systems
Author(s): Bryan Hayes
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper discusses print inspection systems based on digital image processing technology. The basic print inspection task is comparing a reference image to a current image. Upon this technology a number of different applications are based: Print quality check, print process control, order mix-up detection/prevention and (label-based) sorting. The main process parameters are position/orientation of the print, the number of colors printed, the complexity of the print and the set-up of the print inspection system (inline/inline with process control/offline). Important reasons for using print inspection system are: 100% quality control, operator-independent quality standard, yield increase, reduced need for manpower. Print inspection systems consist of a sensor unit containing the illumination and camera and the control computer system equipped with the image processing computer (a frame grabber with dedicated image processing hardware and optionally a CPU), the process computer (controlling the complete system and the I/O) and various I/O facilities (screen, keyboard, operator interface, digital I/O). Three examples of advanced print inspection systems are presented (all of which have been developed, implemented and installed by Basler GmbH): CD label inspection featuring a 3-chip color camera, CD paperwork inspection for detecting order mix-ups, and a mileage indicator inspection system with a line scan camera based sensor unit.

Paper Details

Date Published: 9 November 1994
PDF: 10 pages
Proc. SPIE 2247, Sensors and Control for Automation, (9 November 1994); doi: 10.1117/12.193931
Show Author Affiliations
Bryan Hayes, Basler Image Processing GmbH (Germany)


Published in SPIE Proceedings Vol. 2247:
Sensors and Control for Automation
Markus Becker; R. W. Daniel; Otmar Loffeld, Editor(s)

© SPIE. Terms of Use
Back to Top