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Proceedings Paper

Polarization characterization of Ly alpha holographic gratings with a triple-reflection polarizer
Author(s): Marco Romoli; Silvano Fineschi; Larry D. Gardner; John L. Kohl
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Paper Abstract

The diffraction efficiency of holographic gratings depends on the degree and orientation of the linear polarization of the incident light. A test has been run to measure the reflectance efficiency at Kr 1236 angstrom of two holographic gratings in the orders +1, 0, $min1, as a function of the angle of the incident beam polarization plane. To this purpose, a triple-reflection polarizer, optimized for Ly(alpha) (1216 angstrom) has been fabricated and characterized. The test has been run to demonstrate that the coronal resonantly scattered Ly(alpha) can be measured using a holographic grating in the Ly(alpha) channel of the ultraviolet coronagraph spectrograph (UVCS) of the Solar and Heliospheric Observatory (SOHO) without introducing relevant polarization biases inside the instrument.

Paper Details

Date Published: 7 November 1994
PDF: 10 pages
Proc. SPIE 2283, X-Ray and Ultraviolet Spectroscopy and Polarimetry, (7 November 1994); doi: 10.1117/12.193203
Show Author Affiliations
Marco Romoli, Harvard-Smithsonian Ctr. for Astrophysics and European Space Agency (Italy)
Silvano Fineschi, Harvard-Smithsonian Ctr. for Astrophysics and Univ. di Firenze (Italy)
Larry D. Gardner, Harvard-Smithsonian Ctr. for Astrophysics (United States)
John L. Kohl, Harvard-Smithsonian Ctr. for Astrophysics (United States)


Published in SPIE Proceedings Vol. 2283:
X-Ray and Ultraviolet Spectroscopy and Polarimetry
Silvano Fineschi, Editor(s)

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