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Proceedings Paper

X-ray performance of the engineering prototype Stellar X-Ray Polarimeter
Author(s): Eric H. Silver; Klaus Ziock; J. Dwyer; Philip E. Kaaret; Robert Novick; Ronald F. Elsner; Martin C. Weisskopf; Enrico Costa; Paolo Soffitta; Giuseppe Manzo; Andrea E. Santangelo; Igor Y. Lapshov; Rashid Sunyaev
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Paper Abstract

The performance of the engineering prototype Stellar X-Ray Polarimeter (SXRP) has been evaluated. One hundred percent polarized monochromatic x rays at 2.6 keV and 9.7 keV were used to measure the response of the instrument in the energy bands of the graphite and lithium polarizing elements, respectively. On-line analysis showed that the respective depths of modulation are 96% ad 70% as expected. Irradiating SXRP with broadband unpolarized x rays in the energy band 2 - 17 keV demonstrated that the level of spurious modulation inherent in the instrument is less than 3%. Up-to-date results are presented and compared to the predictions of Monte Carlo simulations.

Paper Details

Date Published: 7 November 1994
PDF: 10 pages
Proc. SPIE 2283, X-Ray and Ultraviolet Spectroscopy and Polarimetry, (7 November 1994); doi: 10.1117/12.193200
Show Author Affiliations
Eric H. Silver, Lawrence Livermore National Lab. (United States)
Klaus Ziock, Lawrence Livermore National Lab. (United States)
J. Dwyer, Columbia Univ. (United States)
Philip E. Kaaret, Columbia Univ. (United States)
Robert Novick, Columbia Univ. (United States)
Ronald F. Elsner, NASA Marshall Space Flight Ctr. (United States)
Martin C. Weisskopf, NASA Marshall Space Flight Ctr. (United States)
Enrico Costa, Istituto di Astrofisica Spaziale/CNR (Italy)
Paolo Soffitta, Istituto di Astrofisica Spaziale/CNR (Italy)
Giuseppe Manzo, Istituto di Fisica Cosmica ed Applicazione dell'Informatica/CNR (Italy)
Andrea E. Santangelo, Istituto di Fisica Cosmica ed Applicazione dell'Informatica-CNR (Italy)
Igor Y. Lapshov, Space Research Institute (Russia)
Rashid Sunyaev, Space Research Institute (Russia)


Published in SPIE Proceedings Vol. 2283:
X-Ray and Ultraviolet Spectroscopy and Polarimetry
Silvano Fineschi, Editor(s)

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