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Proceedings Paper

X-ray tomographic spectroscopy: TOMOSCOP low-energy design concept
Author(s): Muamer Zukic; Michele Wilson McColgan; Douglas G. Torr; Alphonsus John Fennelly; Edward L. Fry
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Paper Abstract

Chemical elements are characterized by the nature of the interaction between their electrons and incoming photons. The uniqueness of a spectral signature of each chemical element is used in spectroscopy for element detection and characterization. We report the design of the detection and chemical composition analysis system, TOMOSCOP, which is based on tomographic spectroscopic imaging at x-ray energies within the 15 - 30 keV range. The detection of the presence of an element or a group of elements and measurements of their concentration in a sample are based on calibration attenuation measurements conducted on known samples. The TOMOSCOP system utilizes x-ray filter spectroscopy for positive identification and concentration measurement of an element within a sample. Tomography combined with spectroscopy provides the unique detection capability of the TOMOSCOP system in which elements and compounds (substances) present within the test volume are localized and detected.

Paper Details

Date Published: 7 November 1994
PDF: 12 pages
Proc. SPIE 2283, X-Ray and Ultraviolet Spectroscopy and Polarimetry, (7 November 1994); doi: 10.1117/12.193189
Show Author Affiliations
Muamer Zukic, Univ. of Alabama in Huntsville (United States)
Michele Wilson McColgan, Advanced Optical Systems (United States)
Douglas G. Torr, Univ. of Alabama in Huntsville (United States)
Alphonsus John Fennelly, Sentel Corp. (United States)
Edward L. Fry, Sentel Corp. (United States)


Published in SPIE Proceedings Vol. 2283:
X-Ray and Ultraviolet Spectroscopy and Polarimetry
Silvano Fineschi, Editor(s)

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