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Proceedings Paper

High-resolution x-ray detection at 1.2 K with niobium superconducting tunnel junctions
Author(s): Peter Verhoeve; Nicola Rando; P. H. Videler; Anthony J. Peacock; Axel van Dordrecht; D. J. Goldie; John M. Lumley; J. Howlett; M. Wallis; R. Venn
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Paper Abstract

X-ray spectra at 6 keV from niobium based superconducting tunnel junctions with highly transmissive tunnel barriers are presented. Signals from the two films can clearly by discriminated by their different temporal and pulse height characteristics. Levels of tunneled charge as high as 2.7 X 106 electrons at 5.9 keV are observed. The best energy resolution obtained at T equals 1.2 K is 53 eV FWHM including electronic noise, for a 50 X 50 micrometers 2 device in a configuration where the x-ray source is collimated to selectively illuminate the center part of the device. Non-linearity is observed which appears dependent on film volume, implying that self recombination may play an important role in these devices. The energy resolution is found to degrade with increasing magnetic field. The spectra from the polycrystalline top film appear significantly degraded if magnetic flux is deliberately trapped in the device.

Paper Details

Date Published: 7 November 1994
PDF: 7 pages
Proc. SPIE 2283, X-Ray and Ultraviolet Spectroscopy and Polarimetry, (7 November 1994); doi: 10.1117/12.193185
Show Author Affiliations
Peter Verhoeve, European Space Agency/ESTEC (Netherlands)
Nicola Rando, European Space Agency/ESTEC (Netherlands)
P. H. Videler, European Space Agency/ESTEC (Netherlands)
Anthony J. Peacock, European Space Agency/ESTEC (Netherlands)
Axel van Dordrecht, European Space Agency/ESTEC (Netherlands)
D. J. Goldie, Oxford Instruments (United Kingdom)
John M. Lumley, Oxford Instruments (United Kingdom)
J. Howlett, Oxford Instruments (United Kingdom)
M. Wallis, Oxford Instruments (United Kingdom)
R. Venn, Cambridge Microfab (United Kingdom)

Published in SPIE Proceedings Vol. 2283:
X-Ray and Ultraviolet Spectroscopy and Polarimetry
Silvano Fineschi, Editor(s)

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