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Proceedings Paper

Charge injection device detectors for x-ray imaging
Author(s): Robert F. Wentink; Joseph Carbone; D. C. Aloisi; Walter M. Gibson; Carolyn A. MacDonald; Q. E. Hanley; Robert E. Fields; M. Bonner Denton
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Paper Abstract

Charge Injection Device (CID) array detectors are well suited for the direct imaging with x- ray and particle beams. In common with CCD detectors, CID arrays have been shown to have good spatial resolution and broad spectral response in the visible range. In addition, CID imagers offer unique architectural features which may be particularly applicable to x-ray and particle beams, including exceptionally large pixel charge capacity, non-destructive pixel readout, and random pixel addressibility. These can dramatically extend the dynamic range, eliminate blooming effects, allow monitoring and dynamic adaptation of application exposure in real-time, improve signal-to-noise by repeated readout and permit the readout of small pixel sub-arrays at exceptionally fast rates. In addition CIDs possess extremely good radiation tolerance. Preliminary results of x-ray measurements with CIDs are presented along with a discussion of potential applications utilizing their unique features.

Paper Details

Date Published: 11 November 1994
PDF: 8 pages
Proc. SPIE 2279, Advances in Multilayer and Grazing Incidence X-Ray/EUV/FUV Optics, (11 November 1994); doi: 10.1117/12.193175
Show Author Affiliations
Robert F. Wentink, CID Technologies, Inc. (United States)
Joseph Carbone, CID Technologies, Inc. (United States)
D. C. Aloisi, Univ. at Albany (United States)
Walter M. Gibson, Univ. at Albany (United States)
Carolyn A. MacDonald, Univ. at Albany (United States)
Q. E. Hanley, Univ. of Arizona (United States)
Robert E. Fields, Univ. of Arizona (United States)
M. Bonner Denton, Univ. of Arizona (United States)


Published in SPIE Proceedings Vol. 2279:
Advances in Multilayer and Grazing Incidence X-Ray/EUV/FUV Optics
Richard B. Hoover; Arthur B. C. Walker, Editor(s)

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