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Proceedings Paper

SIXA: Silicon X-Ray Array
Author(s): Osmi R. Vilhu; J. Huovelin; Tuomo Tikkanen; Pasi Hakala; Panu Muhli; Veikko J. Kamarainen; Heikki Sipila; Ivor Taylor; Juha Pohjonen; Heikki Paivike; Jukka Toivanen; Rashid Sunyaev; Aleksander E. Kuznetsov; Aleksander Abrosimov
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Paper Abstract

The Spectrum-X-Gamma satellite is scheduled for launch in 1995-96. Mission objectives include broad and narrow band imaging spectroscopy over a wide range of energies from the EUV through hard X-rays with an emphasis on studying galactic and extragalactic X-ray sources. Timing and moderate resolution spectroscopy can be performed with the solid state spectrometer SIXA (Silicon X-Ray Array), placed on the focal plane of the SODART telescope with total effective area of 1150 cm2 at 6 keV (for f equals 8 m telescope). The detector consists of 19 circular Si(Li) pixels, each with an active diameter of 9.2 mm and thickness of 3 mm. A radiative cooler will be used to bring the detector to the proper operating temperature (110 - 120 K). The energy range 0.5 - 20 keV is divided into 1024 channels of 20 eV size. Photon can be recorded with 30 microsecond(s) time resolution and 160 - 200 eV (1 - 7 keV) energy resolution. Potential observing programs (for e.g. time-resolved Iron Kalpha line spectroscopy) include stellar coronae, cataclysmic variables and X-ray binaries; accretion discs and coronae of neutron stars and black hole candidates; supernova remnants, active galactic nuclei and clusters of galaxies.

Paper Details

Date Published: 11 November 1994
PDF: 12 pages
Proc. SPIE 2279, Advances in Multilayer and Grazing Incidence X-Ray/EUV/FUV Optics, (11 November 1994); doi: 10.1117/12.193163
Show Author Affiliations
Osmi R. Vilhu, Univ. of Helsinki (Finland)
J. Huovelin, Univ. of Helsinki (Finland)
Tuomo Tikkanen, Univ. of Helsinki (Finland)
Pasi Hakala, Univ. of Helsinki (Finland)
Panu Muhli, Univ. of Helsinki (Finland)
Veikko J. Kamarainen, Metorex International Oy (Finland)
Heikki Sipila, Metorex International Oy (Finland)
Ivor Taylor, Metorex International Oy (Finland)
Juha Pohjonen, Technical Research Ctr. of Finland (Finland)
Heikki Paivike, Technical Research Ctr. of Finland (Finland)
Jukka Toivanen, Technical Research Ctr. of Finland (Finland)
Rashid Sunyaev, Space Research Institute (IKI) (Russia)
Aleksander E. Kuznetsov, Space Research Institute (IKI) (Russia)
Aleksander Abrosimov, Institute of Electromechanics/FVNIIEM (Russia)

Published in SPIE Proceedings Vol. 2279:
Advances in Multilayer and Grazing Incidence X-Ray/EUV/FUV Optics
Richard B. Hoover; Arthur B. C. Walker, Editor(s)

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