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Proceedings Paper

Aspherical imaging multilayer mirrors with subarcsecond resolution for solar XUV telescopes
Author(s): Vladimir A. Slemzin; Igor A. Zhitnik; Eugene N. Ragozin; Eugeny A. Andreev; Nikolai N. Salashchenko; Jury Yak Platonov
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Paper Abstract

For XUV-imaging of the Sun with sub-arc second resolution it is proposed to use the Herschel telescope with aspherical (toroidal) multilayer mirror working at out-of-axis angle 1.5 - 2 degree(s). In that case aberrations (mainly astigmatism) are sufficiently reduced so high resolution better than 1' may be obtained. In comparison with the Ritchey-Chretien two- mirror telescope which is regarded as perspective to reach closely the diffraction limited resolution, the Herschel telescope is more simple, less critical to adjustment and has higher throughput. Toroidal mirrors with diameter D equals 30 mm, focal length F equals 800 mm and ratio of sagittal and meridional radii of curvature Rm/Rs equals 1.001 have been made on super polished fused quartz substrates (roughness better than 7 A). After shape correction mirrors were covered by Mo-Si coating for 175 A wavelength band. The mirrors were used in high resolution channel of the TEREK-C telescope designed for the CORONAS space solar observatory which was launched on March 2, 1994. An example of the solar image obtained by this telescope is presented.

Paper Details

Date Published: 11 November 1994
PDF: 8 pages
Proc. SPIE 2279, Advances in Multilayer and Grazing Incidence X-Ray/EUV/FUV Optics, (11 November 1994); doi: 10.1117/12.193140
Show Author Affiliations
Vladimir A. Slemzin, P.N. Lebedev Physical Institute (Russia)
Igor A. Zhitnik, P.N. Lebedev Physical Institute (Russia)
Eugene N. Ragozin, P.N. Lebedev Physical Institute (Russia)
Eugeny A. Andreev, P.N. Lebedev Physical Institute (Russia)
Nikolai N. Salashchenko, Institute for Physics of Microstructures (Russia)
Jury Yak Platonov, Institute for Physics of Microstructures (Russia)


Published in SPIE Proceedings Vol. 2279:
Advances in Multilayer and Grazing Incidence X-Ray/EUV/FUV Optics
Richard B. Hoover; Arthur B. C. Walker Jr., Editor(s)

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