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Proceedings Paper

Loss anomalies in multilayer planar waveguides
Author(s): Claude Amra; M. Ranier; Catherine Grezes-Besset; Sophie Maure; Frederic Cleva; Ralf Mollenhauer; Gerard Albrand
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Paper Abstract

An apparatus based on guided waves and photothermal techniques permits to measure attenuation coefficients in multilayer waveguides produced by I.A.D. and Ion Plating. Zero- order modes are used to obtain accurate values of extinction coefficients of TiO2 and Ta2O5 thin-film materials at wavelength 514.5 nm. On the other hand, higher-order modes reveal strong loss anomalies that are analyzed via electromagnetic theories of scattering and absorption, both including surface and bulk effects.

Paper Details

Date Published: 4 November 1994
PDF: 16 pages
Proc. SPIE 2253, Optical Interference Coatings, (4 November 1994); doi: 10.1117/12.192179
Show Author Affiliations
Claude Amra, ENSPM (France)
M. Ranier, ENSPM (France)
Catherine Grezes-Besset, ENSPM (France)
Sophie Maure, ENSPM (France)
Frederic Cleva, ENSPM (France)
Ralf Mollenhauer, ENSPM (France)
Gerard Albrand, ENSPM (France)


Published in SPIE Proceedings Vol. 2253:
Optical Interference Coatings
Florin Abeles, Editor(s)

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