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Proceedings Paper

Optical characterization of single- and double-layers with correlated randomly rough boundaries
Author(s): Ivan Ohlidal; Frantisek Vizd'a
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Paper Abstract

Characterization of rough single and double layers is performed by interpreting spectral dependences of the coherent reflectance measured for these layers. Possibilities and limitations of the method are illustrated by means of several concrete samples of both the rough single and double layers represented by models corresponding to fully correlated (identical), partially correlated and fully uncorrelated boundaries.

Paper Details

Date Published: 4 November 1994
PDF: 9 pages
Proc. SPIE 2253, Optical Interference Coatings, (4 November 1994); doi: 10.1117/12.192097
Show Author Affiliations
Ivan Ohlidal, Masaryk Univ. (Czech Republic)
Frantisek Vizd'a, Masaryk Univ. (Czech Republic)


Published in SPIE Proceedings Vol. 2253:
Optical Interference Coatings
Florin Abeles, Editor(s)

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