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Proceedings Paper

New ellipsometric approach for thin anisotropic film investigation
Author(s): Valery N. Filippov; Michael M. Karpuk; Gennadij K. Zhavnerko
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Paper Abstract

An approach of ellipsometric measurements both from ambient media and from transparent or weakly absorbing substrate has been proposed to determine optical constants and thickness of anisotropic films. According to this approach the main refractive indices are calculated by an iterative procedure while an optimization is used to average the values obtained over the parameters measured at one or several incidence angles. The approach proposed has been used for a determination of optical constants and thickness of multimolecular Langmuir-Blodgett films based on the derivative of 5-[4-(stearoylamino)phenyl] isophthtalic acid.

Paper Details

Date Published: 4 November 1994
PDF: 5 pages
Proc. SPIE 2253, Optical Interference Coatings, (4 November 1994); doi: 10.1117/12.192073
Show Author Affiliations
Valery N. Filippov, Institute of Physics (Belarus)
Michael M. Karpuk, Institute of Physics (Belarus)
Gennadij K. Zhavnerko, Institute of Physical Organic Chemistry (Belarus)


Published in SPIE Proceedings Vol. 2253:
Optical Interference Coatings
Florin Abeles, Editor(s)

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