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Proceedings Paper

Light scattering to characterize both faces of transparent substrates: radiative and embedded light
Author(s): Didier Torricini; Claude Amra
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Paper Abstract

An alternative method is presented that allows light scattering technique to characterize both faces of transparent substrates. Experimental results are presented and the limitation of the method is investigated. In addition, a simple formulae is given to approximate the embedded scattering in the substrate, that cannot merge in air. The amount of this embedded scattering cannot be neglected in most cases.

Paper Details

Date Published: 4 November 1994
PDF: 14 pages
Proc. SPIE 2253, Optical Interference Coatings, (4 November 1994); doi: 10.1117/12.192056
Show Author Affiliations
Didier Torricini, INOPTIC (France)
Claude Amra, ENSPM (France)


Published in SPIE Proceedings Vol. 2253:
Optical Interference Coatings
Florin Abeles, Editor(s)

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