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Proceedings Paper

Optical Fourier transform diffractometry for kinoform technology
Author(s): Maciej Sypek; Mariusz Krukowski; Piotr Borowik
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Paper Abstract

This paper presents a simple technique of phase retardation measurement applied to phase object manufacturing. This method is based on computer aided analysis of diffraction pattern generated by phase object. Application of this method to known intensity distribution in Fourier spectrum allows to find phase distribution in an object. The method is especially aligned for techniques where an unknown phase modulation is gained by the exposure of a photosensitive media. The described method can help to predict the desired phase shift from exposure. The phase retardation measurement technique presented in this paper is especially aligned to the problem of Holographic Optical Elements (HOE) manufacturing.

Paper Details

Date Published: 31 October 1994
PDF: 10 pages
Proc. SPIE 1991, Diffractometry and Scatterometry, (31 October 1994); doi: 10.1117/12.192041
Show Author Affiliations
Maciej Sypek, Warsaw Univ. of Technology (Poland)
Mariusz Krukowski, Warsaw Univ. of Technology (Poland)
Piotr Borowik, Warsaw Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 1991:
Diffractometry and Scatterometry
Maksymilian Pluta; Mariusz Szyjer, Editor(s)

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