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Proceedings Paper

Diagnostics of multilayer dielectric coating based on reflection and transmission spectra
Author(s): Yury A. Pervak; Ishtvan V. Fekeshgazi
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Paper Abstract

The various optical components with dielectrical coatings (mirrors, anti-reflection coatings, filters, polarizing and dichroic splitters, etc.) are used broadly in the quantum electronic, laser technique and other branches of optical instrument making. The successful designing of the multi-layer coatings with definite spectral and physicochemical properties are dependent on the authenticity of the parameters of the individual layers. It is known that considerable information about peculiarity of the coating design may be gotten by the measuring of the refractive, transmission and absorption spectra. At this report the results of the investigation of the refractive spectra of multi-layer dielectrical mirrors with symmetrical periods are presented and possibilities of the diagnostic of the structure and some parameters of the individual layers are shown.

Paper Details

Date Published: 31 October 1994
PDF: 5 pages
Proc. SPIE 2113, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (31 October 1994); doi: 10.1117/12.192002
Show Author Affiliations
Yury A. Pervak, Institute of Semiconductor Physics (Ukraine)
Ishtvan V. Fekeshgazi, Institute of Semiconductor Physics (Ukraine)


Published in SPIE Proceedings Vol. 2113:
Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
Sergei V. Svechnikov; Mikhail Ya. Valakh, Editor(s)

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