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Proceedings Paper

Optical/digital system for measurements and diagnostics of surface properties of materials for micro- and optoelectronics
Author(s): Roman S. Bachevsky; Volodymyr A. Dostojny; Leonid I. Muravsky; Arkadiy I. Stefansky; Yurij V. Naidich; Mykola F. Grygorenko
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Paper Abstract

The optical/digital system with solid state array detectors for capillary characteristics of materials and high-temperature melts measuring and diagnostics by sessile-drop method is described. Conditions of sessile drop image forming in the optical scheme of the system are defined. The spatial gradient algorithm for image spatial gradient field forming and gradient maximums localization is proposed. Three methods of sessile drop geometric parameters precise measuring and gradient maximums locations estimation are described. The results of distilled water and mercury sessile drop geometric parameters multiple measurements with the subsequent averaging of obtained data are presented. The perspectives of measurement accuracy increasing and sessile drop image processing time decreasing are discussed.

Paper Details

Date Published: 31 October 1994
PDF: 6 pages
Proc. SPIE 2113, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (31 October 1994); doi: 10.1117/12.191994
Show Author Affiliations
Roman S. Bachevsky, Institute of Physics and Mechanics (Ukraine)
Volodymyr A. Dostojny, Institute of Physics and Mechanics (Ukraine)
Leonid I. Muravsky, Institute of Physics and Mechanics (Ukraine)
Arkadiy I. Stefansky, Institute of Physics and Mechanics (Ukraine)
Yurij V. Naidich, Institute for Materials Science Problems (Ukraine)
Mykola F. Grygorenko, Institute for Materials Science Problems (Ukraine)


Published in SPIE Proceedings Vol. 2113:
Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
Sergei V. Svechnikov; Mikhail Ya. Valakh, Editor(s)

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