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Proceedings Paper

ZnSe quality analysis by x-ray luminescence
Author(s): A. A. Artamonova; V. Ya. Degoda; V. E. Rodionov
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Paper Abstract

The x-ray luminescence of the unintentionally doped polycrystalline ZnSe samples has been studied at the wide spectral range. Comparative study of x-ray luminescence and photoluminescence spectra has been made. The analysis of purity and quality of ZnSe by x-ray luminescent measurements is advantageous because of the bulk character of the x-ray excitation and the possibility of testing big squares. The peculiar features of x-ray spectra of unintentionally doped ZnSe lead us to conclude that this material has high optical quality.

Paper Details

Date Published: 31 October 1994
PDF: 6 pages
Proc. SPIE 2113, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (31 October 1994); doi: 10.1117/12.191974
Show Author Affiliations
A. A. Artamonova, Institute of Semiconductor Physics (Ukraine)
V. Ya. Degoda, Institute of Semiconductor Physics (Ukraine)
V. E. Rodionov, Institute of Semiconductor Physics (Ukraine)


Published in SPIE Proceedings Vol. 2113:
Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
Sergei V. Svechnikov; Mikhail Ya. Valakh, Editor(s)

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