Share Email Print
cover

Proceedings Paper

Luminescence diagnostics of direct-gap semiconductors within a wide range of excitation levels
Author(s): Serhiy G. Shevel; L. V. Taranenko; Vladimir L. Voznyi
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Advantages and limitations of a computer-controlled versalite modular laboratory set-up for spectroscopic diagnostics of materials developed in the Institute of Physics In Kyiv are discussed. Comparison with the options of standard optical multichannel analyzer is made. To illustrate the operation of the system the results on luminescence of direct-gap II-IV semiconductors within a wide (up to 6 orders of magnitude) range of excitation levels are presented.

Paper Details

Date Published: 31 October 1994
PDF: 4 pages
Proc. SPIE 2113, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (31 October 1994); doi: 10.1117/12.191973
Show Author Affiliations
Serhiy G. Shevel, Institute of Physics (Ukraine)
L. V. Taranenko, Institute of Physics (Ukraine)
Vladimir L. Voznyi, Institute of Physics (Ukraine)


Published in SPIE Proceedings Vol. 2113:
Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
Sergei V. Svechnikov; Mikhail Ya. Valakh, Editor(s)

© SPIE. Terms of Use
Back to Top