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Proceedings Paper

Determination of the optical constants of thin absorbing films on a slightly absorbing substrate from photometric measurements
Author(s): Ivan Z. Indutnyi; Apollinary I. Stetsun
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Paper Abstract

The method of determining optical constants of a thin film, deposited on a transparent, or slightly absorbing substrate, is proposed. It requires us to make measurements under normal incidence of the transmittance, the air-incident and substrate-incident reflectances, and film thickness. In the UV spectral region the additional measurements of reflectance for the opaque to light films are needed. It permits us to receive more precise optical constant values even for the high absorbing films. To illustrate the method, optical constants of the GeSe2 and GeSe2Ag0.75 thin films were determined in the wide region of the spectrum.

Paper Details

Date Published: 31 October 1994
PDF: 5 pages
Proc. SPIE 2113, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (31 October 1994); doi: 10.1117/12.191967
Show Author Affiliations
Ivan Z. Indutnyi, Institute of Semiconductor Physics (Ukraine)
Apollinary I. Stetsun, Institute of Semiconductor Physics (Ukraine)


Published in SPIE Proceedings Vol. 2113:
Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
Sergei V. Svechnikov; Mikhail Ya. Valakh, Editor(s)

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