Share Email Print

Proceedings Paper

Evaporated SnS semiconducting thin films
Author(s): K. Deraman; S. B. Sakrani; Mostafa S. Ismail
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Evaporated tin sulphide thin films (SnS) have been prepared onto glass substrates maintained at fixed temperatures in the range 50-300 degree(s)C and controlled film thicknesses. The films are nonstoichiometric, containing both SnS and its higher derivative compounds with different compositions. X-ray results showed that SnS was initially formed at 100 degree(s)C, accumulating and eventually became a stable compound at a substrate temperature, Ts of 300 degree(s)C. Observation on SEM micrographs revealed the existence of nonoriented film structures at low Ts and compacted crystalline structures at Ts equals 300 degree(s)C with the associated change in grain sizes from 0.1 to 1.2 micrometers . Film conductivity increased from 0.62 to 2.54 Sm-1 with increasing substrate temperature. The low temperature measurements showed that the films underwent hopping and free band conduction at temperatures lower and higher than 220 K, respectively. A further investigation on the film's transmittance spectrum shows the dependent of optical bandgaps (1.26-1.07 eV) with substrate temperatures; these were attributed to the changes in the film's compositions.

Paper Details

Date Published: 26 October 1994
PDF: 5 pages
Proc. SPIE 2364, Second International Conference on Thin Film Physics and Applications, (26 October 1994); doi: 10.1117/12.190780
Show Author Affiliations
K. Deraman, Univ. Teknologi Malaysia (Malaysia)
S. B. Sakrani, Univ. Teknologi Malaysia (Malaysia)
Mostafa S. Ismail, Univ. Teknologi Malaysia (Malaysia)

Published in SPIE Proceedings Vol. 2364:
Second International Conference on Thin Film Physics and Applications
Shixun Zhou; Yongling Wang; Yi-Xin Chen; Shuzheng Mao, Editor(s)

© SPIE. Terms of Use
Back to Top