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Proceedings Paper

AES investigation of anodic film on HCT crystal
Author(s): Ting-Lian Wen; Zhiyi Lu; Zhihong Xu; Jiaxiong Fang; Yanjin Li
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Paper Abstract

Auger Electron spectrum (AES) study has been carried out on the anodic film which was deposited by electrochemical method on the surface of Hg1-xCdxTe (HCT) crystal with x approximately equals 0.21. The element depth profile within the film and at the interface with substrate crystal was analyzed by means of Ar+ ions sputtering. The influences of current density, potential and electrolyte concentration during electrochemical deposition on the film structure are manifested.

Paper Details

Date Published: 26 October 1994
PDF: 5 pages
Proc. SPIE 2364, Second International Conference on Thin Film Physics and Applications, (26 October 1994); doi: 10.1117/12.190776
Show Author Affiliations
Ting-Lian Wen, Shanghai Institute of Ceramics (China)
Zhiyi Lu, Shanghai Institute of Ceramics (China)
Zhihong Xu, Shanghai Institute of Ceramics (China)
Jiaxiong Fang, Shanghai Institute of Technical Physics (China)
Yanjin Li, Shanghai Institute of Technical Physics (China)

Published in SPIE Proceedings Vol. 2364:
Second International Conference on Thin Film Physics and Applications
Shixun Zhou; Yongling Wang; Yi-Xin Chen; Shuzheng Mao, Editor(s)

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