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Proceedings Paper

Application of frustrated total reflection
Author(s): Oliver S. Heavens
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Paper Abstract

By the use of total reflection of a laser beam to generate fluorescence in a second medium, surface contours of, e.g., cells may be determined with an accuracy of about 1-2 nm.

Paper Details

Date Published: 26 October 1994
PDF: 4 pages
Proc. SPIE 2364, Second International Conference on Thin Film Physics and Applications, (26 October 1994); doi: 10.1117/12.190746
Show Author Affiliations
Oliver S. Heavens, Univ. of York (United Kingdom)


Published in SPIE Proceedings Vol. 2364:
Second International Conference on Thin Film Physics and Applications
Shixun Zhou; Yongling Wang; Yi-Xin Chen; Shuzheng Mao, Editor(s)

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