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Proceedings Paper

Microstructure of the source material for PbTe film deposition
Author(s): Su-ying Zhang; Ge-ya Wang; Tian-Shen Shi
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Paper Abstract

The microstructure of source material for depositing PbTe high refractive film has been investigated by transmission electron microscopy. The results indicate that the PbTe source material is in good monocrystalline form and the excess Te presents in the form of plate of 5-150 nm on {100} planes. Its density is about 1015 - 1016/cm3 and homogeneously distributed in the matrix.

Paper Details

Date Published: 26 October 1994
PDF: 5 pages
Proc. SPIE 2364, Second International Conference on Thin Film Physics and Applications, (26 October 1994); doi: 10.1117/12.190732
Show Author Affiliations
Su-ying Zhang, Shanghai Institute of Technical Physics (China)
Ge-ya Wang, Shanghai Institute of Metallurgy (China)
Tian-Shen Shi, Shanghai Institute of Metallurgy (China)

Published in SPIE Proceedings Vol. 2364:
Second International Conference on Thin Film Physics and Applications
Shixun Zhou; Yongling Wang; Yi-Xin Chen; Shuzheng Mao, Editor(s)

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