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Proceedings Paper

Comparison of techniques for substrate birefringence measurement
Author(s): Raymond-Noel Kono; Myung S. Jhon; Thomas E. Karis
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Paper Abstract

State of the art techniques for measuring magneto optic disks birefringence are reviewed. As an illustration of one technique, we measured the birefringence of different magneto optic disk substrates by ellipsometry. The retardation data was fitted to an analytical expression as a function of the different indices of refraction. The variation of birefringence with the depth of the substrate is suspected to affect optimum focus and track error signal. A novel scanning micropolarimeter technique for measuring the index of refraction tensor though the depth of the magneto optic substrates is presented. Modeling to study the effects of typical birefringence profiles on the performance characteristic os magneto optic disks using the data from a scanning micropolarimeter is discussed.

Paper Details

Date Published: 12 October 1994
PDF: 13 pages
Proc. SPIE 2338, 1994 Topical Meeting on Optical Data Storage, (12 October 1994); doi: 10.1117/12.190209
Show Author Affiliations
Raymond-Noel Kono, Carnegie Mellon Univ. (United States)
Myung S. Jhon, Carnegie Mellon Univ. (United States)
Thomas E. Karis, IBM Almaden Research Ctr. (United States)


Published in SPIE Proceedings Vol. 2338:
1994 Topical Meeting on Optical Data Storage
David K. Campbell; Martin Chen; Koichi Ogawa, Editor(s)

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