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Proceedings Paper

High-density mark edge recording on a phase-change rewritable disk by a 680-nm laser diode
Author(s): Takashi Ishida; Mamoru Shoji; Yoshiyuki Miyabata; Yasumasa Shibata; Eiji Ohno; Shunji Ohara
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Paper Abstract

This paper reports a study of mark edge recording on the phase change rewritable disk. With the optical head using 680-nm laser diode and lens NA 0.6, 55 dB or higher carrier-to-noise ratio is obtained for signals whose recording mark length is 0.53 micrometers . In mark edge recording it is important to record all marks in their proper lengths. Hence, we first study shift behavior of the beginning and ending edges with regard to all marks, and then propose a new writing compensation method to make up for shifts. In the new compensation method the laser power modulation pattern consists of the first pulse, the multi-pulse chain and the last pulse. Adjusting the first and last pulse positions so that all marks are recorded in their proper lengths makes it possible to accomplish mark edge recording of the RLL (1,7) code with the linear density 0.4 micrometers /bit, jitter (sigma) /T(omega) to 6.5%. For the linear density of 0.35 micrometers /bit as well, a clear eye-pattern is obtained.

Paper Details

Date Published: 12 October 1994
PDF: 6 pages
Proc. SPIE 2338, 1994 Topical Meeting on Optical Data Storage, (12 October 1994); doi: 10.1117/12.190173
Show Author Affiliations
Takashi Ishida, Matsushita Electric Industrial Co., Ltd. (Japan)
Mamoru Shoji, Matsushita Electric Industrial Co., Ltd. (Japan)
Yoshiyuki Miyabata, Matsushita Electric Industrial Co., Ltd. (Japan)
Yasumasa Shibata, Matsushita Electric Industrial Co., Ltd. (Japan)
Eiji Ohno, Matsushita Electric Industrial Co.,Ltd. (Japan)
Shunji Ohara, Matsushita Electric Industrial Co., Ltd. (Japan)


Published in SPIE Proceedings Vol. 2338:
1994 Topical Meeting on Optical Data Storage
David K. Campbell; Martin Chen; Koichi Ogawa, Editor(s)

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