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Proceedings Paper

Midcourse Space Experiment (MSX) thermoelectric quartz crystal microbalances: calibration and characterization
Author(s): Robert J. Bryson; Bryan L. Seiber; William T. Bertrand; John H. Jones; Bob E. Wood; Jeffrey C. Lesho
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Paper Abstract

Operation of thermal control and optical surfaces can be impaired by contamination deposition for space-based systems. Determining the contamination level about the spacecraft and deposition of silicones and hydrocarbons will be studied during the flight of the Midcourse Space Experiment Satellite that is scheduled for launch in 1994. The contaminants will be measured using four thermoelectrically cooled quartz crystal microbalances (TQCMs) which will be mounted on external spacecraft surfaces. Rigorous characterization and calibration measurements were made on six flight TQCMs at the Arnold Engineering Development Center at Arnold Air Force Base, TN. Since the TQCM output frequency depends on some degree on both the crystal temperature and the oscillator-mixer temperature, the magnitude of these effects and the effects of solar irradiation on the TQCMs was established. Long-term frequency drift rates were also determined. The change in TQCM output frequency expected to occur in space was, in some cases less than the magnitude of the frequency changes caused by temperature and solar fluctuations. The results of this study will allow a more accurate assessment of the contamination effects that can be expected during long-term space-flight programs.

Paper Details

Date Published: 19 October 1994
PDF: 13 pages
Proc. SPIE 2261, Optical System Contamination: Effects, Measurements, and Control IV, (19 October 1994); doi: 10.1117/12.190147
Show Author Affiliations
Robert J. Bryson, Calspan Corp. (United States)
Bryan L. Seiber, Calspan Corp. (United States)
William T. Bertrand, Calspan Corp. (United States)
John H. Jones, Calspan Corp. (United States)
Bob E. Wood, Calspan Corp. (United States)
Jeffrey C. Lesho, Johns Hopkins Univ. (United States)


Published in SPIE Proceedings Vol. 2261:
Optical System Contamination: Effects, Measurements, and Control IV
A. Peter M. Glassford, Editor(s)

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