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Proceedings Paper

Measurement of the particulate and water vapor contamination environments of the Midcourse Space Experiment (MSX) spacecraft
Author(s): Gary E. Galica; John J. Atkinson; Giuseppe Aurilio; Orr Shepherd; Jeffrey C. Lesho; Mark T. Boies; Kevin J. Heffernan; Patrick J. McEvaddy; O. Manuel Uy
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Paper Abstract

We have designed, fabricated, and tested two flashlamp-based instruments that will characterize the particulate and water vapor contamination environments aboard the Midcourse Space Experiment (MSX) spacecraft: the Xenon Flashlamp and the Krypton Radiometer. These instruments will operate as part of suite of instruments to monitor the MSX contamination environment over its five-year mission. The Xenon Flashlamp illuminates particles in the field of view of the UVISI Wide Field of View Visible Imager, which in turn measures the scattered radiation. The particle measurement can detect particles smaller than 1 micrometers and can measure cross-field particle velocities from 0.5 cm/sec to 50 m/sec. The Krypton Radiometer measures the local water vapor density. VUV radiation from an array of RF-excited krypton lamps photodissociates H2O in the fields of view of a filtered radiometer and one of the UVISI Spectrographic Imagers. The radiometer and the spectrograph simultaneously measure the intensity of the resulting OH chemiluminescence. The H2O density is proportional to that intensity. The spectrograph will provide a positive identification of the radiating species. Instrument descriptions as well as ground test and simulation data are presented.

Paper Details

Date Published: 19 October 1994
PDF: 12 pages
Proc. SPIE 2261, Optical System Contamination: Effects, Measurements, and Control IV, (19 October 1994); doi: 10.1117/12.190144
Show Author Affiliations
Gary E. Galica, Visidyne, Inc. (United States)
John J. Atkinson, Visidyne, Inc. (United States)
Giuseppe Aurilio, Visidyne, Inc. (United States)
Orr Shepherd, Visidyne, Inc. (United States)
Jeffrey C. Lesho, Johns Hopkins Univ. (United States)
Mark T. Boies, Johns Hopkins Univ. (United States)
Kevin J. Heffernan, Johns Hopkins Univ. (United States)
Patrick J. McEvaddy, Johns Hopkins Univ. (United States)
O. Manuel Uy, Johns Hopkins Univ. (United States)


Published in SPIE Proceedings Vol. 2261:
Optical System Contamination: Effects, Measurements, and Control IV
A. Peter M. Glassford, Editor(s)

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