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Proceedings Paper

n and k measurement of MCT and PST by polarized reflectometry
Author(s): Fei-Fei Wu; Wenzhen Song; Hui-Fen Yu; Runqing Jiang; Xiangyang Li; Zhaopeng Liu
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Paper Abstract

In this paper, the measurement results of n and k of MCT and PST by polarized reflectometry are reported. The results show that in the infrared spectrum region the polarized reflectometry is also an effective method for measurements of n and k.

Paper Details

Date Published: 7 October 1994
PDF: 4 pages
Proc. SPIE 2274, Infrared Detectors: State of the Art II, (7 October 1994); doi: 10.1117/12.189229
Show Author Affiliations
Fei-Fei Wu, Shandong Univ. (China)
Wenzhen Song, Shandong Univ. (China)
Hui-Fen Yu, Shandong Univ. (China)
Runqing Jiang, Shandong Univ. (China)
Xiangyang Li, Shandong Univ. (China)
Zhaopeng Liu, Shandong Univ. (China)


Published in SPIE Proceedings Vol. 2274:
Infrared Detectors: State of the Art II
Randolph E. Longshore, Editor(s)

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