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Proceedings Paper

Polarization BRDF
Author(s): J. Larry Pezzaniti; Russell A. Chipman; Stephen C. McClain
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Paper Abstract

This paper presents a novel measurement technique using a Mueller matrix imaging polarimeter to measure the near-angle polarization BRDF of reflective samples. A measurement is made on a diamond turned aluminum mirror with an rms roughness of 11.4 nm, and the results are interpreted.

Paper Details

Date Published: 7 October 1994
PDF: 8 pages
Proc. SPIE 2260, Stray Radiation in Optical Systems III, (7 October 1994); doi: 10.1117/12.189211
Show Author Affiliations
J. Larry Pezzaniti, Univ. of Alabama in Huntsville (United States)
Russell A. Chipman, Univ. of Alabama in Huntsville (United States)
Stephen C. McClain, Univ. of Alabama in Huntsville (United States)


Published in SPIE Proceedings Vol. 2260:
Stray Radiation in Optical Systems III
Robert P. Breault, Editor(s)

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