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Proceedings Paper

Enhanced backscattering from one-dimensional free-standing dielectric film
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Paper Abstract

It has been known for several years that not only a rough metallic surface but also a rough dielectric surface can produce an enhanced backscattering peak. Due to the difficulty in fabricating one- or two-dimensional dielectric rough surfaces with a high index of refraction or a free-standing film, no experiments have been able to reveal such a peak in scattering from a dielectric rough surface. In this paper we present experimental results of the enhanced backscattering from a free-standing dielectric film and compare these with theoretical analysis. The vacuum/dielectric interface is one-dimensional, randomly rough, while the second dielectric/vacuum interface is approximately planer. The numerical simulations for a one- dimensional, randomly rough free-standing dielectric film reveal some important information about the main mechanism for the enhanced backscattering peak, primarily the presence of the flat dielectric/vacuum interface. We believe that the coherent addition from a given light path that interacts with the rough dielectric surface at two different points due to its reflection from the back surface and its time-reversed partner leads to an enhancement of the intensity of scattering into the retroreflection direction with respect to the intensity of scattering into other directions.

Paper Details

Date Published: 7 October 1994
PDF: 5 pages
Proc. SPIE 2260, Stray Radiation in Optical Systems III, (7 October 1994); doi: 10.1117/12.189210
Show Author Affiliations
Zu-Han Gu, Surface Optics Corp. (United States)
Jun Q. Lu, Surface Optics Corp. (United States)
Alexei A. Maradudin, Univ. of California/Irvine (United States)
Eugenio R. Mendez, Ctr. de Investigacion Cientifica y de Educacion Superior de Ensenada (Mexico)

Published in SPIE Proceedings Vol. 2260:
Stray Radiation in Optical Systems III
Robert P. Breault, Editor(s)

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