Share Email Print
cover

Proceedings Paper

Instrumentation at the National Institue of Standards and Technology for bidirectional reflectance distribution function (BRDF) measurements
Author(s): Clara C. Asmail; Christopher L. Cromer; James Proctor; Jack J. Hsia
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A description is given of the goniometric optical scatter instrumentation (GOSI) which has been developed at NIST for measuring the bidirectional reflectance distribution function (BRDF) from surfaces. The source, goniometer, and receiver are described. The systematic optical and electronic noise of the system is reported. The systematic electronic noise and background scatter have been reduced to allow a detection limit of 1 X 10-9 sr-1. This value is the Rayleigh scattering level from the air molecules in the room with a field of view of 7.2 cm at the sample position for 633 nm incident laser light.

Paper Details

Date Published: 7 October 1994
PDF: 10 pages
Proc. SPIE 2260, Stray Radiation in Optical Systems III, (7 October 1994); doi: 10.1117/12.189203
Show Author Affiliations
Clara C. Asmail, National Institute of Standards and Technology (United States)
Christopher L. Cromer, National Institute of Standards and Technology (United States)
James Proctor, National Institute of Standards and Technology (United States)
Jack J. Hsia, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 2260:
Stray Radiation in Optical Systems III
Robert P. Breault, Editor(s)

© SPIE. Terms of Use
Back to Top