Share Email Print

Proceedings Paper

Three-dimensional image correlation for surface-displacement measurement
Author(s): Jeffrey D. Helm; Michael A. Sutton; Stephen R. McNeill
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper describes a 3D surface profile and displacement measurement system capable of micron level accuracy using moderately priced off-the-shelf equipment. A non-linear optimization based calibration system is presented. The calibration system determines the position and operating characteristics of the cameras as well as correcting for lens distortion. Also presented is a surface profile and displacement measurement system base on projections into space of subsets of the recorded images. This method provides information about both the location and orientation in space of the subset. The accuracy of the system is established through a series of experiments. The calibration is assessed and the results are expressed using several different error measurements including a new error measurement proposed by the authors. The baseline accuracy of the measurement system was determined through a series of profile and translation tests. The system is capable of measurements to an accuracy of 0.003 mm over a 14 mm X 18 mm field from a distance of 416 mm using a 512 X 480 CCD camera and a magnification factor of 27 pixels/mm. The system was also used to measure the bending of a circular plate under pressure loading. The experimental results are analyzed and compared with theoretical prediction.

Paper Details

Date Published: 6 October 1994
PDF: 14 pages
Proc. SPIE 2350, Videometrics III, (6 October 1994); doi: 10.1117/12.189151
Show Author Affiliations
Jeffrey D. Helm, Univ. of South Carolina (United States)
Michael A. Sutton, Univ. of South Carolina (United States)
Stephen R. McNeill, Univ. of South Carolina (United States)

Published in SPIE Proceedings Vol. 2350:
Videometrics III
Sabry F. El-Hakim, Editor(s)

© SPIE. Terms of Use
Back to Top