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Proceedings Paper

Contour analysis algorithms for high-speed inspection
Author(s): Knut Kille
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Paper Abstract

The visual inspection of many industrial products is based on contour analysis. The main task is the detection of defects like cracks and chips. The automation of this visual inspection procedure requires robust and flexible systems and algorithms. This paper describes new contour analysis algorithms for defect detection. Innovative techniques for contour filtering and analysis (e.g., scale-space analysis) are presented. The performance of different approaches is shown by several industrial examples and applications.

Paper Details

Date Published: 13 October 1994
PDF: 10 pages
Proc. SPIE 2354, Intelligent Robots and Computer Vision XIII: 3D Vision, Product Inspection, and Active Vision, (13 October 1994); doi: 10.1117/12.189086
Show Author Affiliations
Knut Kille, Fraunhofer Institute for Manufacturing Engineering and Automation (Germany)


Published in SPIE Proceedings Vol. 2354:
Intelligent Robots and Computer Vision XIII: 3D Vision, Product Inspection, and Active Vision
David P. Casasent, Editor(s)

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