Share Email Print
cover

Proceedings Paper

Detection of secondary reflections using morphology
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper discusses very simple but effective one-dimensional morphological techniques for the identification of primary and secondary peak locations associated with reflected light patterns from glass surfaces. A common optical technique for measuring glass thickness and related properties is to observe light reflected from the glass surfaces. Two reflections can be observed when an appropriate structured light source is used to illuminate a glass surface. A very bright primary reflection associated with the reflection from the front surface will be observed along with a much fainter secondary reflection from the back surface. The secondary reflection is difficult to detect reliably given the large difference in magnitude between the two peaks, the presence of noise, and the varying amounts of overlap between the two peaks that can occur. The methods described in the paper have been implemented successfully for two vision applications using images acquired using standard matrix and linear cameras. The signal is preprocessed using one-dimensional morphological and linear methods to normalize the background and remove noise. Further morphological operations are performed to identify the peaks associated with primary and secondary reflections.

Paper Details

Date Published: 3 October 1994
PDF: 6 pages
Proc. SPIE 2347, Machine Vision Applications, Architectures, and Systems Integration III, (3 October 1994); doi: 10.1117/12.188741
Show Author Affiliations
John W. V. Miller, Univ. of Michigan/Dearborn (United States)
Behrouz N. Shabestari, Edison Industrial Systems Ctr. (United States)


Published in SPIE Proceedings Vol. 2347:
Machine Vision Applications, Architectures, and Systems Integration III
Bruce G. Batchelor; Susan Snell Solomon; Frederick M. Waltz, Editor(s)

© SPIE. Terms of Use
Back to Top