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Proceedings Paper

Digital moire applications in automated inspection
Author(s): Anand Krishna Asundi; Sajan R. Marokkey; Gaylord G. Olson; Jo Norvelle Walker
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Paper Abstract

Machine vision systems routinely utilize structured light techniques for identifying the shapes of defects of the objects under inspection. The basic principle of the method is that any height difference from a reference plane causes a shift in the projection line of light either to left or right and up or down in the image plane of the recording camera. The height difference if due to a defect on an otherwise regular surface will result in a deformed light pattern corresponding to the dimensions of the defect. Moire patterns generated from this deformed light pattern can quantify the defect size, depth and shape. Existing machine vision systems use these techniques for the inspection of flat surfaces. Curved surface inspection although significant remains more or less unexplored. This paper presents the application of a TDI (Time Delay and Integration) camera for defect visualization on curved objects. The TDI operation and some applications of high speed TDI imaging will also be discussed.

Paper Details

Date Published: 3 October 1994
PDF: 6 pages
Proc. SPIE 2347, Machine Vision Applications, Architectures, and Systems Integration III, (3 October 1994); doi: 10.1117/12.188738
Show Author Affiliations
Anand Krishna Asundi, Univ. of Hong Kong (Singapore)
Sajan R. Marokkey, Univ. of Hong Kong (Singapore)
Gaylord G. Olson, Electrim Corp. (United States)
Jo Norvelle Walker, Electrim Corp. (United States)


Published in SPIE Proceedings Vol. 2347:
Machine Vision Applications, Architectures, and Systems Integration III
Bruce G. Batchelor; Susan Snell Solomon; Frederick M. Waltz, Editor(s)

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