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Proceedings Paper

Challenges in IR system testing
Author(s): Gerald C. Holst
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Paper Abstract

A new generation of test equipment must be developed to meet the calibration needs of evolving infrared imaging systems. New systems can no longer be simply called sensors -- they are sensors with built-in computers. These systems modify images in new ways. As such, the traditional definitions of NEDT, MRT, MTF, and fixed pattern noise are questioned. New metrics may be needed to describe system performance. New performance metrics may also evolve that are less prone to measurements errors.

Paper Details

Date Published: 17 October 1994
PDF: 9 pages
Proc. SPIE 2269, Infrared Technology XX, (17 October 1994); doi: 10.1117/12.188677
Show Author Affiliations
Gerald C. Holst, EO Technologies (United States)


Published in SPIE Proceedings Vol. 2269:
Infrared Technology XX
Bjorn F. Andresen, Editor(s)

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