Proceedings PaperChallenges in IR system testing
|Format||Member Price||Non-Member Price|
|GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free.||Check Access|
A new generation of test equipment must be developed to meet the calibration needs of evolving infrared imaging systems. New systems can no longer be simply called sensors -- they are sensors with built-in computers. These systems modify images in new ways. As such, the traditional definitions of NEDT, MRT, MTF, and fixed pattern noise are questioned. New metrics may be needed to describe system performance. New performance metrics may also evolve that are less prone to measurements errors.