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Proceedings Paper

Field measurement technique for infrared camera characterization
Author(s): Alexis P. Tzannes
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Paper Abstract

This paper is an extension of previous work which dealt with characterizing the performance of staring PtSi infrared cameras, based on estimating their spatial frequency response. Applying a modified knife edge technique, we arrive at an estimate of the edge spread function (ESF), which is used to obtain a profile through the center of the two-dimensional modulation transfer function (MTF). In this paper, we demonstrate that this technique is applicable as a field measurement. The resolution of the system can be calculated using the width of the line spread function (LSF) and an image of an object of known width. In addition, by applying this technique at long range, the MTF of the atmosphere can be measured.

Paper Details

Date Published: 17 October 1994
PDF: 7 pages
Proc. SPIE 2269, Infrared Technology XX, (17 October 1994); doi: 10.1117/12.188676
Show Author Affiliations
Alexis P. Tzannes, Rome Lab. (United States)


Published in SPIE Proceedings Vol. 2269:
Infrared Technology XX
Bjorn F. Andresen, Editor(s)

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