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Proceedings Paper

Handheld imaging using PtSi, InSb, and HgCdTe focal plane technology
Author(s): Norman B. Stetson; Joseph W. Landry
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Paper Abstract

This paper presents the InfraCAMTM concept, key components, and test results for the standard production PtSi unit. In addition it shows test results using both InSb and HgCdTe arrays as they apply to InfraCAM.

Paper Details

Date Published: 17 October 1994
PDF: 9 pages
Proc. SPIE 2269, Infrared Technology XX, (17 October 1994); doi: 10.1117/12.188664
Show Author Affiliations
Norman B. Stetson, Inframetrics, Inc. (United States)
Joseph W. Landry, Inframetrics, Inc. (United States)


Published in SPIE Proceedings Vol. 2269:
Infrared Technology XX
Bjorn F. Andresen, Editor(s)

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