Share Email Print
cover

Proceedings Paper

In-pixel self-calibrating IRFPA
Author(s): Pierre Nicolas; Philippe Pantigny; Jacques Cluzel; Michel Vilain; Jean-Louis Ouvrier-Buffet; Jean-Jacques Yon
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In this paper we present a staring IRFPA including an in-pixel dc current suppression scheme. This circuit allows a self-calibration mode (SCM) suppressing the dc current. A 64 X 64 IRFPA with 100 micrometers pitch and 4.2 micrometers cut-off wavelength MCT PV detectors has been achieved and tested at 200 K. At this temperature, the ratio between dark and useful photonic current is close to 100. After SCM, the residual integrated current is reduced to typically 1% of the detector initial current. This enables the integration time to be increased by two orders of magnitude, which drastically improves IRFPA sensitivity and resolution. At 200 K operating temperature, we obtained a peak wavelength responsivity (R(lambda p)) of 1010 V/W and a noise equivalent differential temperature (NEDT) (temporally noise limited) of 80 mK (30 degree(s) FOV, 300 K background, 200 Hz frame rate). The SCM circuit avoids integration and readout of useless information and thus releases the signal-to-noise ratio (SNR) required for the readout integrated circuit (ROIC). This makes circuit design easier, for both multiplexers and output stages, and reduces the number of bits required for digital image processing.

Paper Details

Date Published: 17 October 1994
PDF: 11 pages
Proc. SPIE 2269, Infrared Technology XX, (17 October 1994); doi: 10.1117/12.188657
Show Author Affiliations
Pierre Nicolas, CEA/LETI (France)
Philippe Pantigny, CEA/LETI (France)
Jacques Cluzel, CEA/LETI (France)
Michel Vilain, CEA/LETI (France)
Jean-Louis Ouvrier-Buffet, CEA/LETI (France)
Jean-Jacques Yon, CEA/LETI (France)


Published in SPIE Proceedings Vol. 2269:
Infrared Technology XX
Bjorn F. Andresen, Editor(s)

© SPIE. Terms of Use
Back to Top