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Microroughness, statistical surface models, and bidirectional reflection distribution function (BRDF): functions of smooth surfaces
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Paper Abstract

The calculation of the BRDF (Bi-Directional-Reflection-Distribution-Function) from profile measurements was performed theoretically and verified by measurements on a BK7 sample. The assumptions on the surface topography and approximations done are highlighted.

Paper Details

Date Published: 30 September 1994
PDF: 10 pages
Proc. SPIE 2210, Space Optics 1994: Space Instrumentation and Spacecraft Optics, (30 September 1994); doi: 10.1117/12.188111
Show Author Affiliations
Bernd Harnisch, European Space Agency/ESTEC (Netherlands)
Thomas Weigel, European Space Agency/ESTEC (Netherlands)

Published in SPIE Proceedings Vol. 2210:
Space Optics 1994: Space Instrumentation and Spacecraft Optics
Thierry M. Dewandre; Joachim J. Schulte-in-den-Baeumen; Emmanuel Sein, Editor(s)

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