Share Email Print
cover

Proceedings Paper

Nonphotolithographic fabrication of large computer-generated diffractive optical elements
Author(s): Cynthia L. Vernold; Tomas D. Milster
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Large computer generated diffractive optical elements (DOE's) are useful in many applications. Typical sizes of DOE's range from 6 inches up to two meters in diameter. Current state-of-the-art techniques for fabricating these DOE's involve photolithographic processing where photoresist is used as the light sensitive medium and an etchable metal layer is used to form the pattern of the DOE. Handling and costs associated with photolithographic methods become critical issues when the DOE's become large. It is therefore advantageous to have a technique that would not require the photolithographic step in the process. This paper will discuss the instrument and the technique used at the Optical Sciences Center (OSC) for fabricating large computer generated DOE's. A non-photolithographic technique of thermally selective oxidization is used to transfer the DOE pattern onto a metallic film on the substrate. The subsequent etching part of the process takes advantage of the differential etch rates of a non-oxidized and oxidized metal. Figure results indicate the accuracy of using this approach to fabricate DOE's is better than (lambda) /100 rms.

Paper Details

Date Published: 30 September 1994
PDF: 9 pages
Proc. SPIE 2263, Current Developments in Optical Design and Optical Engineering IV, (30 September 1994); doi: 10.1117/12.187993
Show Author Affiliations
Cynthia L. Vernold, Optical Sciences Ctr./Univ. of Arizona (United States)
Tomas D. Milster, Optical Sciences Ctr./Univ. of Arizona (United States)


Published in SPIE Proceedings Vol. 2263:
Current Developments in Optical Design and Optical Engineering IV
Robert E. Fischer; Warren J. Smith, Editor(s)

© SPIE. Terms of Use
Back to Top