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Proceedings Paper

Reliability characterization of UV-curable adhesives used in optical devices
Author(s): Irene M. Plitz; Osman S. Gebizlioglu; Michael Patrick Dugan
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Paper Abstract

UV (ultra-violet)-curable adhesives were identified as the underlying cause for failure of devices subjected to accelerated aging conditions. These adhesives must be resistant to degradation and dimensional/mechanical instabilities such as creep. We examined two UV-curable adhesives and found that thermal post-curing caused some shrinkage and degradation. However, post-curing also raised the adhesive glass transition temperature, thereby reducing the reliability risk associated with mechanical instability. We investigated the dimensional/mechanical stability of UV adhesives by measuring thermal expansion/contraction and creep compliance. We found that the adhesive thermal expansion and creep compliance are large enough to pose device reliability risk. Raising the glass transition temperature of UV-curable adhesives by thermal post-cure can improve optical device reliability by lowering the creep compliance.

Paper Details

Date Published: 28 September 1994
PDF: 10 pages
Proc. SPIE 2290, Fiber Optic Materials and Components, (28 September 1994); doi: 10.1117/12.187412
Show Author Affiliations
Irene M. Plitz, Bell Communications Research (United States)
Osman S. Gebizlioglu, Bell Communications Research (United States)
Michael Patrick Dugan, Anadigics, Inc. (United States)

Published in SPIE Proceedings Vol. 2290:
Fiber Optic Materials and Components
Hakan H. Yuce; Dilip K. Paul; Roger A. Greenwell, Editor(s)

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