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Proceedings Paper

Correlation of 0.67um scatter with local stress in Ge impacted with the modified Cambridge liquid jet device
Author(s): Michael Wilson; D. Price; Steve Strohecker
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Paper Abstract

Germanium witness samples were impacted with the NAWCADWAR modified Cambridge liquid jet device introducing varying levels of damage about the center of each sample. Surface damage statistics were collected, scatter measurements were made at 0.67 micrometers and the samples were failed in tension using a bi-axial flexure test setup. The level and character of the damage was correlated with the reflected scatter measurements as a function of local stress and flaw size distribution. Bi-axial flexure data was analyzed to predict fracture stress and the probability of failure of the germanium samples. The mechanical data were then correlated with the scatter data in order to correlate the BRDF with the material failure. The BRDF measurements were taken in several different orientations in order to study the differences in scatter character for the in-plane and out-of-plane conditions.

Paper Details

Date Published: 28 September 1994
PDF: 12 pages
Proc. SPIE 2286, Window and Dome Technologies and Materials IV, (28 September 1994); doi: 10.1117/12.187334
Show Author Affiliations
Michael Wilson, Naval Air Warfare Ctr. (United States)
D. Price, Aerospace Mass Properties Analysis Corp. (United States)
Steve Strohecker, Aerospace Mass Properties Analysis Corp. (United States)


Published in SPIE Proceedings Vol. 2286:
Window and Dome Technologies and Materials IV
Paul Klocek, Editor(s)

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