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Proceedings Paper

Silicon detector probe for gamma-ray and x-ray backscatter radiation
Author(s): Eugenia T. Halmagean; Cristian C. Lazarovici; Doina N. Lazarovici; Valerica Cimpoca; Marian N. Udrea-Spinea
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Paper Abstract

The paper presents an application of photodiodes of typical series production, specially selected for detector array in a X, gamma probe for checking the nonuniformity of structures. The probe is used in connection to a measuring unit, as a portable instrument.

Paper Details

Date Published: 21 September 1994
PDF: 9 pages
Proc. SPIE 2305, Gamma-Ray Detector Physics and Applications, (21 September 1994); doi: 10.1117/12.187261
Show Author Affiliations
Eugenia T. Halmagean, Research and Development Institute for Semiconductor Devices (Romania)
Cristian C. Lazarovici, Institute of Atomic Physics (Romania)
Doina N. Lazarovici, Institute of Atomic Physics (Romania)
Valerica Cimpoca, Institute of Atomic Physics (Romania)
Marian N. Udrea-Spinea, Semiconductor Devices Baneasa S.A. (Romania)


Published in SPIE Proceedings Vol. 2305:
Gamma-Ray Detector Physics and Applications
Elena Aprile, Editor(s)

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