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Proceedings Paper

Integrated x-ray testing of the electro-optical breadboard model for the X-ray Multimirror Mission (XMM) reflection grating spectrometer
Author(s): Jay V. Bixler; Henry J. M. Aarts; Wolfgang Burkert; Antonius J. F. den Boggende; Graziella Branduardi-Raymont; Heinrich W. Braeuninger; A. C. Brinkman; William W. Craig; Todd A. Decker; Luc Dubbeldam; Christian Erd; Charles J. Hailey; Jan-Willem den Herder; Fred A. Jansen; Steven M. Kahn; Piet A. J. de Korte; C. W. Mauche; Frits B. S. Paerels; Knud Thomsen
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Paper Abstract

X-ray calibration of the Electro-Optical Breadboard Model (EOBB) of the XMM Reflection Grating Spectrometer has been carried out at the Panter test facility in Germany. The EOBB prototype optics consisted of a four-shell grazing incidence mirror module followed by an array of eight reflection gratings. The dispersed x-rays were detected by an array of three CCDs. Line profile and efficiency measurements were made at several energies, orders, and geometric configurations for individual gratings and for the grating array as a whole. The x-ray measurements verified that the grating mounting method would meet the stringent tolerances necessary for the flight instrument. Post EOBB metrology of the individual gratings and their mountings confirmed the precision of the grating boxes' fabrication. Examination of the individual grating surface's at micron resolution revealed the cause of anomalously wide line profiles to be scattering due to the crazing of the replica's surface.

Paper Details

Date Published: 16 September 1994
PDF: 12 pages
Proc. SPIE 2280, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy V, (16 September 1994); doi: 10.1117/12.186828
Show Author Affiliations
Jay V. Bixler, Lawrence Livermore National Lab. (United States)
Henry J. M. Aarts, Space Research Organization (Netherlands)
Wolfgang Burkert, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Antonius J. F. den Boggende, Space Research Organization (Netherlands)
Graziella Branduardi-Raymont, Mullard Space Science Lab./Univ. College London (United Kingdom)
Heinrich W. Braeuninger, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
A. C. Brinkman, Space Research Organization (Netherlands)
William W. Craig, Lawrence Livermore National Lab. (United States)
Todd A. Decker, Lawrence Livermore National Lab. (United States)
Luc Dubbeldam, Space Research Organization (Netherlands)
Christian Erd, European Space Agency (Netherlands)
Charles J. Hailey, Lawrence Livermore National Lab. (United States)
Jan-Willem den Herder, Space Research Organization (Netherlands)
Fred A. Jansen, Space Research Organization (Netherlands)
Steven M. Kahn, Lawrence Livermore National Lab. and Univ. of California/Berkeley (United States)
Piet A. J. de Korte, Space Research Organization (Netherlands)
C. W. Mauche, Lawrence Livermore National Lab. (United States)
Frits B. S. Paerels, Univ. of California/Berkeley (United States)
Knud Thomsen, Paul Scherrer Institut (Switzerland)


Published in SPIE Proceedings Vol. 2280:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy V
Oswald H. W. Siegmund; John V. Vallerga, Editor(s)

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