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Proceedings Paper

In-orbit performance of the spectrometers of the Extreme Ultraviolet Explorer
Author(s): William T. Boyd; Patrick N. Jelinsky; David S. Finley; Jean Dupuis; M. Abbott; C. Christian; Roger F. Malina
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Paper Abstract

The Extreme Ultraviolet Explorer (EUVE), launched on June 7, 1992, is an extremely successful NASA astrophysics mission that contains three extreme ultraviolet (EUV) spectrometers designed to be used in pointed spectroscopic observations of astrophysical sources in the 70-760 angstrom wavelength region. The spectrometers utilize a slitless design based on grazing- incidence optics and variable line-space gratings. Detailed wavelength scales determined from ground-based calibrations and refined with in-orbit data are used to assign wavelengths for each detected photon to within half a resolution element (less that 0.8 angstrom in all cases). Spectral resolving power (FWHM of non-Gaussian profiles) varies in the range R approximately 150-450. Spectrometer throughputs were determined from an extensive laboratory calibration and then were adjusted slightly based on in-flight calibration spectra of known astrophysical continuum sources (hot DA white dwarf stars). We also have measured count rates from the detector and the geocoronal and distributed backgrounds, parameters critical to assessment of accurate flux levels from the astrophysical sources.

Paper Details

Date Published: 16 September 1994
PDF: 17 pages
Proc. SPIE 2280, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy V, (16 September 1994); doi: 10.1117/12.186819
Show Author Affiliations
William T. Boyd, Univ. of California/Berkeley (United States)
Patrick N. Jelinsky, Univ. of California/Berkeley (United States)
David S. Finley, Univ. of California/Berkeley (United States)
Jean Dupuis, Univ. of California/Berkeley (United States)
M. Abbott, Univ. of California/Berkeley (United States)
C. Christian, Univ. of California/Berkeley (United States)
Roger F. Malina, Univ. of California/Berkeley (United States)

Published in SPIE Proceedings Vol. 2280:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy V
Oswald H. W. Siegmund; John V. Vallerga, Editor(s)

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