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Proceedings Paper

Importance of electron tracking in understanding the response of proportional counters
Author(s): Jeffrey R. Youngen; Martin C. Weisskopf; Kurtis L. Dietz; Robert A. Austin; Stephen L. O'Dell; Brian D. Ramsey; Allyn F. Tennant
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Paper Abstract

Design, construction, and sensitivity estimates for the performance of proportional counters customarily neglect the consequences of the finite path length of electrons resulting from the primary interaction between the incident x-ray and the proportional counter gas. In many situations this can lead to errors in response functions as a result of ignoring 'charge sharing' between adjacent proportional counter cells which are held in anti-coincidence, or charge lost by the electrons escaping the gas volume into the detector window or into inactive regions. We illustrate the importance of these effects with Monte-Carlo simulations.

Paper Details

Date Published: 16 September 1994
PDF: 9 pages
Proc. SPIE 2280, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy V, (16 September 1994); doi: 10.1117/12.186808
Show Author Affiliations
Jeffrey R. Youngen, NASA Marshall Space Flight Ctr. (United States)
Martin C. Weisskopf, NASA Marshall Space Flight Ctr. (United States)
Kurtis L. Dietz, NASA Marshall Space Flight Ctr. (United States)
Robert A. Austin, NASA Marshall Space Flight Ctr. (United States)
Stephen L. O'Dell, NASA Marshall Space Flight Ctr. (United States)
Brian D. Ramsey, NASA Marshall Space Flight Ctr. (United States)
Allyn F. Tennant, NASA Marshall Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 2280:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy V
Oswald H. W. Siegmund; John V. Vallerga, Editor(s)

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