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Proceedings Paper

Progressive censoring: an efficient method to reduce time consumption of accelerated lifetime tests
Author(s): Hans-Dieter Hartmann
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Paper Abstract

Progressively censored data obtained from accelerated life time tests on contact chains of individual contact interconnect (CI) systems connected by probe pads were compared to simulated complete data sets. Depending on stress conditions, the time required to gain 1% of precision (95% confidence) of low percentiles, tprec, can be as low as 2% of that required for complete data. As progressive censoring allows for the start of experiments with a high number of objects, simultaneous failures of CI systems are observable. It turned out that ignoring these `multiple failures' (`MFs') can lead to a considerable overestimation of reliability, if `MFs' are accumulated at early failures. A new test structure allowing for automated testing of individual CI systems in series is proposed. Several methods of evaluation of data obtainable from the test structure are discussed in detail using maximum likelihood estimation of simulated data. A `1 out of X' assumption of detected failed subparts of the test structure turned out to be sufficient in most cases of possible accumulations of `MFs.' Life time is overestimated if early `MFs' are ignored. The problem of assessing normality of complete, and progressively censored data is discussed.

Paper Details

Date Published: 14 September 1994
PDF: 10 pages
Proc. SPIE 2334, Microelectronics Manufacturability, Yield, and Reliability, (14 September 1994); doi: 10.1117/12.186753
Show Author Affiliations
Hans-Dieter Hartmann, SICAN GmbH (Germany)

Published in SPIE Proceedings Vol. 2334:
Microelectronics Manufacturability, Yield, and Reliability
Barbara Vasquez; Hisao Kawasaki, Editor(s)

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