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Proceedings Paper

Microwave imaging in inhomogeneous media
Author(s): Hsiu C. Han; Chao-Sheng Wang
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Paper Abstract

To remotely image objects in a lossy inhomogeneous material requires advance knowledge on the geometry and electrical properties of the host material, as well as the positions of the transmitter and receiver relative to the host structure. Separate measurements with different apparatus are often required for obtaining this essential information. In this paper, we present a systematic approach to simultaneously retrieve information regarding both the target and the host material with a single synthetic aperture measurement. A variety of techniques have been invoked in this composite approach to extract the location, orientation, and mean propagation constant of the host structure. These parameters are subsequently used in the image focusing algorithm. It is shown that a substantial improvement in the image quality over a conventional pulse-echo system can be achieved.

Paper Details

Date Published: 14 September 1994
PDF: 5 pages
Proc. SPIE 2275, Advanced Microwave and Millimeter-Wave Detectors, (14 September 1994); doi: 10.1117/12.186719
Show Author Affiliations
Hsiu C. Han, Iowa State Univ. (United States)
Chao-Sheng Wang, Iowa State Univ. (United States)


Published in SPIE Proceedings Vol. 2275:
Advanced Microwave and Millimeter-Wave Detectors
Satish S. Udpa; Hsiu C. Han, Editor(s)

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